1st US Workshop Ellipsometry

TBD, 2027, in Lincoln, NE

Welcome Message

You are cordially invited to the 10th International Conference on Spectroscopic Ellipsometry, ICSE-10, to be held 08-13 June 2025 at the University of Colorado, Boulder, Colorado. 

The ICSE Conferences are the premier gatherings of experts and non-experts alike to share knowledge and learn about the latest advances and applications of spectroscopic ellipsometry and related techniques.  The meeting consists of a wide variety of tutorials, invited talks, presentations, and posters that cover all aspects of the field, and provides ample opportunities for networking and discussion.  The equipment display will cover the latest not only in ellipsometry but also in other methods of learning about surfaces, interfaces, thin films, nanostructures, and bulk materials under both static and dynamic conditions through the use of polarized light.

The meeting will be held on the campus of the University of Colorado at Boulder.  The campus is in the foothills of the Rocky Mountains, and is about an hour away from the Denver Airport by public transportation.  Boulder is known for its blend of urban and outdoor activities, including a vibrant downtown and talented brewers and chefs.  The pedestrian Pearl Street Mall includes numerous art galleries, cafes, restaurants, and boutiques.  In addition to spectacular scenery, Boulder provides a wealth of recreational opportunities including biking and hiking.  The Rocky Mountain National Park is about 1 ½ hours away.

Organizing Committee

Mathias Schubert

University of Nebraska-Lincoln (USA) & Lund University (Sweden)

David E. Aspnes

North Carolina State University (USA)

Alain C. Diebold

CNSE, University at Albany, SUNY (USA)

Eva Schubert

University of Nebraska-Lincoln (USA)
Workforce and Sponsoring Chair

Markus Raschke

University of Colorado at Boulder (USA)
Local Chair

Theory

  • Artificial Intelligence and Machine Learning
  • Data Analysis
  • Fast data processing
  • Optical Modeling (Finite Element, ab-initio, …)
  • Subwavelength Structure Analysis and Modeling
  • Time-dependence

Instrumentation

  • Imaging Ellipsometry and High-Resolution
  • Metrology
  • Mueller-Matrix Spectroscopy
  • New Developments
  • Nonlinear and Time-Resolved Ellipsometry
  • THz and Extreme Ultraviolet

Applications

  • Advanced Semiconductor Metrology
  • Anisotropy and Anisotropic Materials
  • Artificial Intelligence and Machine Learning
  • Bio- and Life-Sciences
  • Correlated Systems
  • Chemistry and Biochemistry
  • Ferroelectrics, Piezoelectrics, Ferromagnetics, Antiferromagnetics, Multiferroics
  • High-Entropy Materials
  • Imaging
  • Interfaces
  • Liquid Crystals
  • Mueller-Matrix Polarimetry and Scatterometry
  • Nanomaterials
  • Optical Properties
  • Organics and Polymers
  • Photovoltaics and Renewable Energy Materials
  • Quantum Materials and Materials for Quantum Applications
  • Real-time Process Monitoring and Control
  • Two-Dimensional Systems
Logo of the Arbeitskreis Ellipsometrie (AKE) - Paul Drude e.V.